• Shopping Cart
    There are no items in your cart

BS EN 61751:1998

Current

Current

The latest, up-to-date edition.

Laser modules used for telecommunication. Reliability assessment

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-09-1998

€271.12
Excluding VAT

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
    4.1 Demonstration of product quality
    4.2 Testing responsibilities
    4.3 Quality Improvement Programmes (QIPs)
5 Tests
    5.1 Structural similarity
    5.2 Burn-in and screening (when applicable in the
          DS)
6 Activities
    6.1 Analysis of reliability results
    6.2 Technical visits to LMMs
    6.3 Design/process changes
    6.4 Deliveries
    6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure
mechanisms
Annex B (informative) Guide
Annex ZA Normative references to international publications
with their corresponding European publications
Figures
A.1 Non-linearities in laser-current characteristics
A.2 "Bathtub" failure rate curve
A.3 Example of cumulative failure plot showing log-normal
      distribution of laser failure rate
A.4 Calculated failure rates for components having a
      log-normal distribution of laser failure rate
A.5 Cross-section through a typical laser module showing
      key components
A.6 Cross-section through a typical buried heterostructure
      laser (bonded junction side up)

Covers reliability assessment of laser modules for telecommunication. Intended to create a standard procedure for assessment of the reliability of laser modules so as to minimize risks and for promotion of product development and reliability.

Committee
GEL/86
DevelopmentNote
Supersedes 93/203878 DC. Also numbered as IEC 61751. (09/2005)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
SN EN 61751 : 1998 Identical
NF EN 61751 : 1998 Identical
EN 61751:1998 Identical
NBN EN 61751 : 1998 Identical
I.S. EN 61751:1999 Identical
DIN EN 61751:1998-11 Identical

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN ISO 9000:2015 Quality management systems - Fundamentals and vocabulary (ISO 9000:2015)

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.