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  • EN 61751:1998

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Laser modules used for telecommunication - Reliability assessment

    Available format(s): 

    Withdrawn date:  23-07-2013

    Language(s): 

    Published date:  10-04-1998

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Laser reliability and quality assurance procedure
      4.1 Demonstration of product quality
      4.2 Testing responsibilities
      4.3 Quality Improvement Programmes (QIPs)
    5 Tests
      5.1 Structural similarity
      5.2 Burn-in and screening (when applicable in the DS)
    6 Activities
      6.1 Analysis of reliability results
      6.2 Technical visits to LMMs
      6.3 Design/process changes
      6.4 Deliveries
      6.5 Supplier documentation
    Annex A (normative) Laser diode and laser module failure mechanisms
    Annex B (informative) Guide
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    The aim of this standard is: - to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; - to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 86
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Withdrawn

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
    IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN ISO 9000:2015 Quality management systems - Fundamentals and vocabulary (ISO 9000:2015)
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