• BS EN 61751:1998

    Current The latest, up-to-date edition.

    Laser modules used for telecommunication. Reliability assessment

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  15-09-1998

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Laser reliability and quality assurance procedure
        4.1 Demonstration of product quality
        4.2 Testing responsibilities
        4.3 Quality Improvement Programmes (QIPs)
    5 Tests
        5.1 Structural similarity
        5.2 Burn-in and screening (when applicable in the
              DS)
    6 Activities
        6.1 Analysis of reliability results
        6.2 Technical visits to LMMs
        6.3 Design/process changes
        6.4 Deliveries
        6.5 Supplier documentation
    Annex A (normative) Laser diode and laser module failure
    mechanisms
    Annex B (informative) Guide
    Annex ZA Normative references to international publications
    with their corresponding European publications
    Figures
    A.1 Non-linearities in laser-current characteristics
    A.2 "Bathtub" failure rate curve
    A.3 Example of cumulative failure plot showing log-normal
          distribution of laser failure rate
    A.4 Calculated failure rates for components having a
          log-normal distribution of laser failure rate
    A.5 Cross-section through a typical laser module showing
          key components
    A.6 Cross-section through a typical buried heterostructure
          laser (bonded junction side up)

    Abstract - (Show below) - (Hide below)

    Covers reliability assessment of laser modules for telecommunication. Intended to create a standard procedure for assessment of the reliability of laser modules so as to minimize risks and for promotion of product development and reliability.

    General Product Information - (Show below) - (Hide below)

    Committee GEL/86
    Development Note Supersedes 93/203878 DC. Also numbered as IEC 61751. (09/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
    IEC 60747-12-2:1995 Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN ISO 9000:2015 Quality management systems - Fundamentals and vocabulary (ISO 9000:2015)
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