BS IEC 60747-10:1991
Current
The latest, up-to-date edition.
Semiconductor devices Generic specification for discrete devices and integrated circuits
Hardcopy , PDF
English
31-07-2011
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Appendix A - Lot tolerance per cent defective
(LTPD) sampling plans
Appendix B - Dimensions to be checked
Appendix C - Directions for applied forces for
mechanical tests
Appendix D - (informative) - Assessment of quality
levels in ppm (parts per million)
Publication(s) referred to
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
| Committee |
EPL/47
|
| DevelopmentNote |
Issue Date: 31/07/2011. 1991 Edition incorporates corrigendum to BS QC700000(1991). Renumbers and supersedes BS QC700000(1991). Supersedes 86/24762 DC and BS 9970-0(1985). Together with BS IEC 60748-11, it Supersedes BS 9450(1998). (08/2011)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ).
This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits.
It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for:
measurement methods of electrical characteristics;
climatic and mechanical tests;
endurance tests.
NOTE This publication must be supplemented by the approved sectional, family and blank detail specifications, where they exist, appropriate to the specific individual type or types.
| Standards | Relationship |
| IEC 60747-10:1991 | Identical |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS 3934-3:1992 | Mechanical standardization of semiconductor devices Recommendations for the preparation of outline drawings of integrated circuits |
| BS 6493-1.2:1984 | Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
| BS 3934-1:1992 | Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices |
| BS 6100-3.1:1986 | Glossary of building and civil engineering terms. Services Energy sources and distribution |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS QC790100(1991) : 1991 AMD 10586 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
| BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
| BS 6001-1(1999) : 1999 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION |
| BS 7151(1989) : AMD 7825 | SPECIFICATION FOR REPRESENTATION OF DATES AND TIMES IN INFORMATION INTERCHANGE |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 6493-2.2(1986) : 1986 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS |
| BS 6493-1.3:1986 | Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes |
| BS 3934-2(1992) : 1992 AMD 13374 | MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS |
| BS 6493-2.3:1987 | Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.