BS IEC 60747-16.2 : 2001
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 16-2: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY PRESCALERS
Hardcopy , PDF
English
01-01-2001
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Essential ratings and characteristics
4.1 General
4.2 Application-related description
4.3 Specification of the function
4.4 Limiting values (absolute maximum rating system)
4.5 Operating conditions (within the specified
operating temperature range)
4.6 Electrical characteristics
4.7 Mechanical and environmental ratings,
characteristics and data
4.8 Additional information
5 Measuring methods
5.1 General
5.2 Output power (P[o])
5.3 Output voltage (V[o])
5.4 Minimum operating input power (P[i, min])
5.5 Maximum operating input power (P[i, max])
5.6 Minimum operating input voltage (V[i, min])
5.7 Maximum operating input voltage (V[i, max])
5.8 Maximum input frequency (f[i, max])
5.9 Minimum input frequency (f[i, min])
5.10 High-level modulus control input voltage (V[CH])
5.11 Low-level modulus control input voltage (V[CL])
5.12 High-level modulus control input current (I[CH])
5.13 Low-level modulus control input current (I[CL])
Provides terminology and letter symbols, essential ratings and characteristics, as well as measuring methods for the integrated circuit microwave frequency prescalers.
| Committee |
EPL/47
|
| DevelopmentNote |
Together with BS EN 60747-16-1, partially supersedes BS 6493-1.4(1992) (07/2002) Supersedes 99/204497 DC. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-16-2:2001+AMD1:2007 CSV | Identical |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.