BS IEC 62679-1-1:2014
Current
Current
The latest, up-to-date edition.
Electronic paper displays Terminology
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
31-07-2014
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
EPL/100
|
| DevelopmentNote |
Supersedes 12/30244653 DC. (07/2014)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
IEC 62679-1-1:2014 gives the preferred terms, their definitions, as well as the symbols for electronic paper displays (EPDs).
| Standards | Relationship |
| IEC 62679-1-1:2014 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60191-1:2007 | Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
| IEC 61966-2-1:1999 | Multimedia systems and equipment - Colour measurement and management - Part 2-1: Colour management - Default RGB colour space - sRGB |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| ISO 8601:2004 | Data elements and interchange formats Information interchange Representation of dates and times |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 62679-3-1:2014 | Electronic paper displays - Part 3-1: Optical measuring methods |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.