• BS IEC 62679-1-1:2014

    Current The latest, up-to-date edition.

    Electronic paper displays Terminology

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-07-2014

    Publisher:  British Standards Institution

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    IEC 62679-1-1:2014 gives the preferred terms, their definitions, as well as the symbols for electronic paper displays (EPDs).

    General Product Information - (Show below) - (Hide below)

    Committee EPL/100
    Development Note Supersedes 12/30244653 DC. (07/2014)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

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    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    IEC 61966-2-1:1999 Multimedia systems and equipment - Colour measurement and management - Part 2-1: Colour management - Default RGB colour space - sRGB
    ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    ISO 80000-1:2009 Quantities and units — Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 62679-3-1:2014 Electronic paper displays - Part 3-1: Optical measuring methods
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
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