BS IEC 63003:2015
Current
The latest, up-to-date edition.
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Hardcopy , PDF
English
31-01-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants
Pertains to military and aerospace automatic test equipment (ATE) testing applications.
| Committee |
EPL/501
|
| DocumentType |
Standard
|
| Pages |
174
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
| Standards | Relationship |
| IEC 63003:2015 | Identical |
| MIL-DTL-55302 Revision G:2009 | CONNECTORS, PRINTED CIRCUIT SUBASSEMBLY AND ACCESSORIES |
| IEEE 260.3-1993 | American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 945-1984 | IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology |
| IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
| MIL C 83733 : C | CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR |
| IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
| MIL-PRF-28800 Revision F:1996 | TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR |
| MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.