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BS IEC 63003:2015
Current
The latest, up-to-date edition.
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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM
Hardcopy , PDF
English
31-01-2016
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants
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