BS QC 720100:1991
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
Hardcopy , PDF
25-04-2012
English
20-12-1991
Important note : Users cannot be edited or removed once added to your Multi user PDF.
Committees responsible
National foreword
Specification
1 Scope
2 General
2.1 Related document
2.2 Recommended values of temperature (preferred
values)
2.3 Recommended values of voltages and currents
(preferred values)
2.4 Terminal identification
3 Quality assessment procedures
3.1 Primary stage of manufacture and subcontracting
3.2 Structurally similar devices
3.2.1 Grouping for electrical and optical
characteristic tests in Groups A and/or B
3.2.2 Grouping for environmental and mechanical tests
in Groups B and/or C
3.2.3 Grouping for endurance tests
3.3 Inspection requirements for qualification
approval
3.4 Quality conformance inspection
3.4.1 Division into groups and sub-groups
3.5 Group D tests
3.6 Screening
3.7 Sampling requirements
4 Test and measurement procedures
4.1 Light emitting diodes, infrared emitting diodes,
general measurements
4.2 Photocouplers
4.3 Laser diodes
4.4 Photodiodes and phototransistors
4.5 Other devices (under consideration)
Appendices
A Structural similarity
B Dimensions
C Directions of applied forces for mechanical tests
Tables
I Group A: Lot by lot
II Group B: Lot by lot
III Group C: Periodic
IV Screening (under consideration)
V Sampling requirements for Group A tests
VI Sampling requirements for Group B and C tests, in
which LTPD shall be used
Figures
1 Orientation of a cylindrical device to direction
of applied force
2 Other type of package
Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 86/21275 DC (08/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Standards | Relationship |
| IEC 60747-12:1991 | Identical |
| BS QC 720106:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
| BS QC720101(1995) : 1995 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS |
| BS QC 720105:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
| BS IEC 60747-12.1 : 1995 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS |
| BS QC 720102:1997 | Blank detail specification for laser diode modules with pigtail for fibre optic systems and subsystems |
| BS 6493-1.2:1984 | Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
| BS 3934-1:1992 | Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 6001-1:1991 | Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
| BS 6493-1.5(1985) : 1985 | SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR OPTOELECTRONIC DEVICES |
| BS 2011-2.2N:1977 | Environmental testing. Guidance Test N. Guidance on change of temperature tests |
| BS QC 001002:1991 | Rules of procedure of the IEC quality assessment system for electronic components (IECQ) |
| BS 6493-1.3:1986 | Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes |
| BS 3934-2(1992) : 1992 AMD 13374 | MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
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