Committee
|
EPL/47 |
Development Note
|
Also numbered as IEC 60747-12-2 Supersedes 92/04361 DC (08/2005) |
Document Type
|
Standard |
ISBN
|
|
Pages
|
|
Published
|
|
Publisher
|
British Standards Institution
|
Status
|
Withdrawn |
Supersedes
|
|
IEC 60747-12:1991
|
Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices |
IEC 60747-10:1991
|
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
IEC 60747-5:1992
|
Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
IEC 60191-2:2012 DB
|
Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 60747-1:2006+AMD1:2010 CSV
|
Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV
|
Semiconductor devices - Mechanical and climatic test methods |
IEC 60068-2-14:2009
|
Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
BS QC 720100:1991
|
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
BS QC700000(1991) : 1991
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
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