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BS QC 750106:1993

Current

Current

The latest, up-to-date edition.

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-07-1993

€165.94
Excluding VAT

Committee
EPL/47
DevelopmentNote
Also numbered as IEC 60747-8-2 (08/2005)
DocumentType
Standard
Pages
20
PublisherName
British Standards Institution
Status
Current

BS 6493-1.2:1984 Semiconductor devices. Discrete devices Recommendations for rectifier diodes
BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS QC 750112:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
BS 6493-1.8:1985 Semiconductor devices. Discrete devices Recommendations for field-effect transistors
BS 3934-2(1992) : 1992 AMD 13374 MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 750000(1986) : 1986 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION

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