BS QC 750106:1993
Current
Current
The latest, up-to-date edition.
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-07-1993
Publisher
Committee |
EPL/47
|
DevelopmentNote |
Also numbered as IEC 60747-8-2 (08/2005)
|
DocumentType |
Standard
|
Pages |
20
|
PublisherName |
British Standards Institution
|
Status |
Current
|
BS 6493-1.2:1984 | Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
BS QC 750112:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
BS 6493-1.8:1985 | Semiconductor devices. Discrete devices Recommendations for field-effect transistors |
BS 3934-2(1992) : 1992 AMD 13374 | MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS |
BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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