BS QC 750112:1988
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-12-1988
Publisher
Withdrawn date
25-04-2012
€188.48
Excluding VAT
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semiconductor devices and specifies quality assessment, test and measurement procedures. Deals with field effect transistors.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-8-1 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| BS QC 750106:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6493-1.8:1985 | Semiconductor devices. Discrete devices Recommendations for field-effect transistors |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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