CEI EN 60749-11 : 2004
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
Hardcopy , PDF
English
01-01-2004
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Defines the rapid change of temperature test method and the two-fluid-bath method.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-21 (04/2004) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-11:2002 | Identical |
| EN 60749-11:2002 | Identical |
| IEC 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
| EN 60749-3:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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