IEC 60749-11:2002
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Hardcopy , PDF
12-04-2002
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62185 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-11 : 2002 | Identical |
| NEN EN IEC 60749-11 : 2002 | Identical |
| I.S. EN 60749-11:2002 | Identical |
| PN EN 60749-11 : 2004 | Identical |
| BS EN 60749-11:2002 | Identical |
| EN 60749-11:2002 | Identical |
| DIN EN 60749-11:2003-04 | Identical |
| CEI EN 60749-11 : 2004 | Identical |
| UNE-EN 60749-11:2003 | Identical |
| I.S. EN 60749-11:2002 | Equivalent |
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