CEI EN 61751 : 1999
Current
The latest, up-to-date edition.
LASER MODULES USED FOR TELECOMMUNICATION - RELIABILITY ASSESSMENT
Hardcopy , PDF
English
01-01-1999
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and
quality assurance
procedure
5 Tests
Annex A (normative) - Laser
diode and laser module
failure mechanisms
Annex B (informative) - Guide
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Covers reliability assessment of laser modules for telecommunication. Intended to create a standard procedure for assessment of the reliability of laser modules so as to minimize risks and for promotion of product development and reliability.
| Committee |
CT 86
|
| DevelopmentNote |
Classificazione CEI 86-80 (08/2001)
|
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61751:1998 | Identical |
| EN 61751:1998 | Identical |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
| IEC 60747-12-2:1995 | Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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