CEI EN 61967-4 : 2009
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
Hardcopy , PDF
English
01-01-2009
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FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) - Probe calibration procedure
Annex B (informative) - Classification of conducted
emission levels
Annex C (informative) - Example of reference levels
for automotive applications
Annex D (informative) - EMC requirements and how
to use EMC IC measurement techniques
Annex E (informative) - Example of a test set-up
consisting of an EMC main test board and
EME IC test board
Annex F (informative) - 150 ohm direct coupling networks
for common mode emission measurements of
differential mode data transfer ICs and similar
circuits
Annex ZA (normative) - Normative references to
international publications with their corresponding
European publications
Defines a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-1024. (08/2015)
|
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 61967-4 : 2002 COR 2017 | Identical |
| EN 55016-1-4:2010/A2:2017 | SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-4: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNAS AND TEST SITES FOR RADIATED DISTURBANCE MEASUREMENTS (CISPR 16-1-4:2010/A2:2017) |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements |
| CISPR 16-1-1:2015 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus |
| CISPR 16-1-3:2004+AMD1:2016 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power |
| CISPR 16-1-5:2014+AMD1:2016 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 55016-1-5:2015/A1:2017 | SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-5: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNA CALIBRATION SITES AND REFERENCE TEST SITES FOR 5 MHZ TO 18 GHZ (CISPR 16-1-5:2014/A1:2016) |
| EN 55016-1-3:2006/A1:2016 | SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-3: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANCILLARY EQUIPMENT - DISTURBANCE POWER (CISPR 16-1-3:2004) |
| EN 61000-4-6:2014/AC:2015 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013) |
| EN 55016-1-1:2010/A2:2014 | SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-1: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - MEASURING APPARATUS (CISPR 16-1-1:2010/A2:2014) |
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