CEI EN 62008 : 2006
Current
The latest, up-to-date edition.
PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
Hardcopy , PDF
English
01-01-2006
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and symbols
4 General requirements
5 Hardware functionality for calibration
6 Software calibration methods
7 Calibration procedures
Annex A (informative) - Examples of calculation of
modular DAQ system uncertainty
Annex B (normative) - Pseudo-code to perform static
test by method B and a numerical example
Annex C (informative) - ADM characteristics
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Describes the performance characteristics and calibration methods for digital data acquisition systems and relevant software to ensure that all measurement systems relying on DAQ devices meet a common standard.
| Committee |
CT 85
|
| DevelopmentNote |
Classificazione CEI 85-35. (04/2006)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62008:2005 | Identical |
| EN 62008:2005 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEC 60748-4-3:2006 | Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) |
| IEC 60359:2001 | Electrical and electronic measurement equipment - Expression of performance |
| IEC 61083-1:2001 | Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
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