EIA 554 : 1996
Current
Current
The latest, up-to-date edition.
METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2002
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1. INTRODUCTION
2. SCOPE
3. APPLICATION
4. APPLICABLE DOCUMENTS
5. DEFINITIONS
6. ASSUMPTIONS
7. METHODS
8. SUMMARY
Gives guidance for selecting standardized methods for estimating the proportion nonconforming expressed as PPM.
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Government Electronics & Information Technology Association
|
| Status |
Current
|
| MIL-R-39008 Revision C:1990 | RESISTOR, FIXED, COMPOSITION (INSULATED), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| BS EN 62258-1:2010 | Semiconductor die products Procurement and use |
| MIL C 39003 : H | CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL C 55681 : D SUPP 1 | CAPACITOR, CHIP, MULTIPLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| I.S. EN 62258-1:2010 | SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
| EN 62258-1:2010 | Semiconductor die products - Part 1: Procurement and use |
| 01/206130 DC : DRAFT AUG 2001 | IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY |
| ISO 14560:2004 | Acceptance sampling procedures by attributes Specified quality levels in nonconforming items per million |
| ISO 28597:2017 | Acceptance sampling procedures by attributes — Specified quality levels in nonconforming items per million |
| MIL R 55342 : C | RESISTORS, FIXED, FILM, CHIP, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL C 23269 : E | CAPACITORS, FIXED, GLASS DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL R 39005 : D | RESISTOR, FIXED, WIREWOUND, (ACCURATE), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL C 39014 : E | CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL C 39006 : E | CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| PD ES 59008-2:1999 | Data requirements for semiconductor die Vocabulary |
| MIL R 39015 : C (3) | RESISTOR, VARIABLE, WIRE WOUND (LEAD SCREW ACTUATED), ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL C 83421 : B | CAPACITOR, FIXED, SUPERMETALLIZED PLASTIC FILM DIELECTRIC, (DC, AC, OR DC AND AC) HERMETICALLY SEALED IN METAL CASES, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL R 39007 : G (3) SUPP 1A | RESISTORS, FIXED, WIRE-WOUND (POWER TYPE), NONESTABLISHED RELIABILITY, ESTABLISHED RELIABILITY, AND SPACE LEVEL, GENERAL SPECIFICATION FOR |
| BS ISO 28597:2017 | Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million |
| MIL C 55514 : C | CAPACITOR, FIXED, PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC, DC OR DC AC, IN NONMETAL CASES, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL C 49467 : (2) SUPP 1 | CAPACITORS, FIXED, CERAMIC, MULTILAYER, HIGH VOLTAGE (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL-R-874 Base Document:1990 | RESISTOR NETWORKS, FIXED, FILM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL C 49464 : A | CAPACITORS, CHIP, SINGLE LAYER, FIXED, PARALLEL PLATE, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY |
| MIL R 914 : 0 | RESISTOR NETWORKS, FIXED, FILM, SURFACE MOUNT, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL R 39009 : C (3) SUPP 1 | RESISTOR, FIXED, WIREWOUND (POWER TYPE, CHASSIS MOUNTED) ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| BS ISO 14560:2004 | Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million |
| MIL C 39001 : B | CAPACITOR, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR.. |
| MIL R 55182 : F | RESISTORS, FIXED, FILM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL C 55365 : C (5) | CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL R 39017 : E (5) SUPP 1 | RESISTOR, FIXED, FILM (INSULATED) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| IEC 62258-1:2009 | Semiconductor die products - Part 1: Procurement and use |
| CEI EN 62258-1 : 2011 | SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
| EIA 591 : 1992(R2002) | ASSESSMENT OF QUALITY LEVELS IN PPM USING VARIABLES TEST DATA |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.