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  • MIL C 55681 : D SUPP 1

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    CAPACITOR, CHIP, MULTIPLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR

    Available format(s): 

    Superseded date:  03-07-1997

    Language(s): 

    Published date:  12-01-2013

    Publisher:  US Military Specs/Standards/Handbooks

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    Abstract - (Show below) - (Hide below)

    Describes established reliability, ceramic dielectric, multiple layer, chip capacitors. Coverage includes classification, style, capacitance tolerance, termination finish, applicable documents, specification sheets, reliability, quality, body structure, terminations, voltage conditioning, body structure, capacitance, dissipation factor, insulation resistance, and solderabilty.

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    Committee FSC 5910
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-198 Revision E:1984 CAPACITOR, SELECTION AND USE OF
    MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
    MIL-HDBK-11991 Base Document:1996 DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPONS SYSTEMS
    MIL D 83531 : A (3) DELAY LINES, PASSIVE
    MIL-E-11991 Revision E:1983 ELECTRONIC, ELECTRICAL, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPON SYSTEMS, GENERAL SPECIFICATION FOR
    MIL R 28750 : C SUPP 1 RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING
    MIL D 83532 : A (3) SUPP 1 DELAY LINES, ACTIVE
    MIL-P-11268 Revision L:1983 PART, MATERIALS, AND PROCESSES USED IN ELECTRONIC EQUIPMENT

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL C 39028 : C CAPACITORS, PACKAGING OF
    MIL-STD-810 Revision G:2008 ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS
    EIA 554 : 1996 METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
    MIL-STD-790 Revision G:2011 ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
    QQ-S-571 Revision F:1994 SOLDER, ELECTRONIC (96 TO 485 DEGREES C)
    MIL-F-14256 Revision F:1993 FLUX, SOLDERING, LIQUID (ROSIN BASE)
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
    MIL-STD-690 Revision D:2005 Failure Rate (FR) Sampling Plans and Procedures
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