EN 120000 : 1996
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES
03-09-1999
12-01-2013
PART 1: Semiconductor optoelectronic and liquid devices
1 SCOPE
2 GENERAL
3 QUALITY ASSESSMENT PROCEDURES
4 TEST AND MEASUREMENT CONDITIONS
5 LASER MODULE RELIABILITY
PART 2: Visual inspection of LCD and rejection criteria
1 General
2 Visual inspection of viewing area
3 Seal inspection
4 Visual inspection of contact surface
5 Visual inspection for chipped material at the corners
and edges of the glass plates
6 Visual inspection of the display
PART 3: Visual inspection requirements for opto-electronic
semiconductor devices
1 General
2 Visual inspection requirements for dies
3 Visual inspection requirements for bonded die
4 Visual inspection requirements for packaged
devices
PART 4: Capability approval
1 Introduction
2 Terminology
3 Procedure for granting the capability approval
4 Capability approval maintenance procedure
5 Procedure for reduction, extension or change of
capability
6 Procedure in case of deficiency in maintenance of the
capability approval
7 Capability manual
8 Capability test programme
9 Verification of capability (audit)
10 Quality assurance of products delivered under
capability approval
11 Marking and ordering information
12 Capability abstract for publication purposes
13 Customer detail specifications
14 Standard catalogue items detail specifications
15 Detail specification register
16 Handling
17 Product safety
PART 5: Semiconductor laser diodes, laser diode modules
and laser diode assemblies of assessed quality -
Capability approval
1 General
2 Quality assessment procedures
3 Test and measurement procedures
Describes the terms, definitions, symbols, quality assessment procedures and test methods necessary to prepare detail specifications (DS) for semiconductor optoelectronic and liquid crystal devices in the CECC System.
| DevelopmentNote |
Supersedes CECC 20000. (02/2012)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| UNE-EN 120000:1996 | Identical |
| DIN EN 120000:1996-09 | Identical |
| I.S. EN 120000:1998 | Identical |
| BS EN 120000:1996 | Identical |
| BS EN 130800:2001 | Harmonized system of quality assessment for electronic components. Sectional specification. Tantalum surface mounting capacitors |
| EN 130800 : 2000 AMD 1 2003 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: TANTALUM SURFACE MOUNTING CAPACITORS |
| 98/263682 DC : DRAFT SEP 1998 | PREN 50309 - OPTICAL FIBRE AMPLIFIER RELIABILITY STANDARD |
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