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  • EN 61747-1:1999/A1:2003

    Current The latest, up-to-date edition.

    LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION

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    Published date:  24-04-2003

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terminology
          3.1 Physical concepts
          3.2 General terms
          3.3 Terms related to ratings and characteristics
    4 Technical aspects
          4.1 Order of precedence
          4.2 Terminology, units and symbols
          4.3 Preferred values of temperature, humidity and
                 pressure
          4.4 Marking
                 4.4.1 Device identification
                 4.4.2 Device traceability
                 4.4.3 Packing
          4.5 Categories of assessed quality
          4.6 Screening
          4.7 Handling
    5 Quality assessment procedures
          5.1 Eligibility for qualification approval
                 5.1.1 Primary stage of manufacture
          5.2 Commercially confidential information
          5.3 Formation of inspection lots
          5.4 Structurally similar devices
          5.5 Granting of qualification approval
          5.6 Quality conformance inspection
                 5.6.1 Division into groups and subgroups
                 5.6.2 Inspection requirements
                 5.6.3 Supplementary procedure for reduced
                          inspection
                 5.6.4 Sampling requirements for small lots
                 5.6.5 Certified records of released lots
                          (CRRL)
                 5.6.6 Delivery of devices subjected to
                          destructive or non-destructive tests
                 5.6.7 Delayed deliveries
                 5.6.8 Supplementary procedure for deliveries
          5.7 Statistical sampling procedures
                 5.7.1 AQL sampling plans
                 5.7.2 LTPD sampling plans
          5.8 Endurance tests
          5.9 Endurance tests where the failure rate is
                 specified
                 5.9.1 General
                 5.9.2 Selection of samples
                 5.9.3 Failure
                 5.9.4 Endurance test time and sample size
                 5.9.5 Procedure to be used if the number of
                          observed failures exceeds the
                          acceptance number
          5.10 Accelerated test procedures
          5.11 Capability approval
    6 Test and measurement procedures
          6.1 Standard atmospheric conditions for electrical
                 and optical measurements
          6.2 Physical examination
                 6.2.1 Visual examination
                 6.2.2 Dimensions
                 6.2.3 Permanence of marking
          6.3 Electrical and optical measurements
                 6.3.1 General conditions and precautions
          6.4 Environmental tests
    Annex A (informative) Cross references index
    Annex B (informative) Example of outline drawings of liquid
                          crystal display cells
    Annex C (normative) Orientation of LCD modules
    Annex D (normative) Lot tolerance percentage defective
                        (LTPD) sampling plans
    Table D.1 - LTPD sampling plans - Minimum size of samples to
                be tested to ensure, with a 90 percent
                confidence, that a lot having a percentage of
                defective devices equal to the specified LTPD
                will not be accepted (single sample)
    Table D.2 - Hypergeometric sampling plans for small lot
                sizes of 200 or less
    Table D.3 - AQL and LTPD sampling plans

    Abstract - (Show below) - (Hide below)

    Describes general procedures for quality assessment to be used in the IEQC system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.

    General Product Information - (Show below) - (Hide below)

    Committee SR 110
    Development Note Supersedes EN 120000 (06/2000)
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61747-5-2:2011 Liquid crystal display devices Environmental, endurance and mechanical test methods. Visual inspection of active matrix colour liquid crystal display modules
    CEI EN 61747-4-1 : 2005 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    CEI EN 61747-10-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL
    CEI EN 61747-30-1 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE
    I.S. EN 61747-5-2:2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    EN 61747-5-2 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    EN 61747-5-3 : 2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    EN 61747-6-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 6-3: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - MOTION ARTIFACT MEASUREMENT OF ACTIVE MATRIX LIQUID CRYSTAL DISPLAY MODULES
    BS EN 61747-2-1:2013 Liquid crystal display devices Passive matrix monochrome LCD modules. Blank detail specification
    I.S. EN 61747-30-1:2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE (IEC 61747-30-1:2012 (EQV))
    CEI EN 61747-5-2 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - VISUAL INSPECTION OF ACTIVE MATRIX COLOUR LIQUID CRYSTAL DISPLAY MODULES
    I.S. EN 61747-4-1:2005 LIQUID CRYSTAL DISPLAY DEVICES - PART 4-1: MATRIX COLOUR LCD MODULES - ESSENTIAL RATINGS AND CHARACTERISTICS
    I.S. EN 61747-2-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION (IEC 61747-2-1:2013 (EQV))
    CEI EN 61747-4 : 2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS
    I.S. EN 61747-10-1:2013 LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL (IEC 61747-10-1:2013 (EQV))
    I.S. EN 61747-5-3:2010 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    BS EN 61747-10-1:2013 Liquid crystal display devices Environmental, endurance and mechanical test methods. Mechanical
    BS EN 61747-4:2012 Liquid crystal display devices Liquid crystal display modules and cells. Essential ratings and characteristics
    BS EN 61747-6-3:2011 Liquid crystal display devices Measuring methods for liquid crystal display modules. Motion artifact measurement of active matrix liquid crystal display modules
    CEI EN 61747-5-3 : 2011 LIQUID CRYSTAL DISPLAY DEVICES - PART 5-3: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - GLASS STRENGTH AND RELIABILITY
    I.S. EN 61747-4:2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 4: LIQUID CRYSTAL DISPLAY MODULES AND CELLS - ESSENTIAL RATINGS AND CHARACTERISTICS (IEC 61747-4:2012 (EQV))
    CEI EN 61747-3 : 2007 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DISPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-3 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
    BS EN 61747-30-1:2012 Liquid crystal display devices Measuring methods for liquid crystal display modules. Transmissive type
    BS EN 61747-5-3:2010 Liquid crystal display devices Environmental, endurance and mechanical test methods. Glass strength and reliability
    BS EN 61747-4-1:2004 Liquid crystal display devices Matrix colour LCD modules. Essential ratings and characteristics
    BS EN 61747-6-2:2011 Liquid crystal display devices Measuring methods for liquid crystal display modules. Reflective type
    CEI EN 61747-2-1 : 2014 LIQUID CRYSTAL DISPLAY DEVICES - PART 2-1: PASSIVE MATRIX MONOCHROME LCD MODULES - BLANK DETAIL SPECIFICATION
    BS EN 61747-3:2006 Liquid crystal display devices Liquid crystal display (LCD) cells. Sectional specification
    I.S. EN 61747-3:2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3: LIQUID CRYSTAL DIPLAY (LCD) CELLS - SECTIONAL SPECIFICATION
    EN 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
    EN 61747-10-1:2013 Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods – Mechanical
    EN 61747-6-2:2011 Liquid crystal display devices - Part 6-2: Measuring methods for liquid crystal display modules - Reflective type
    EN 61747-30-1 : 2012 LIQUID CRYSTAL DISPLAY DEVICES - PART 30-1: MEASURING METHODS FOR LIQUID CRYSTAL DISPLAY MODULES - TRANSMISSIVE TYPE (IEC 61747-30-1:2012)
    EN 61747-4-1:2004 Liquid crystal display devices - Part 4-1: Matrix colour LCD modules - Essential ratings and characteristics

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
    ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
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