EN 60191-6-20:2010
Current
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The latest, up-to-date edition.
Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ)
Published date
15-10-2010
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IEC 60191-6-20:2010 specifies methods to measure package dimensions of small outline J-lead-packages (SOJ), package outline form E in accordance with IEC 60191-4.
Committee |
CLC/TC 47X
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
IEC 60191-6-20:2010 | Identical |
NF EN 60191-6-20 : 2011 | Identical |
NBN EN 60191-6-20 : 2010 | Identical |
NEN EN IEC 60191-6-20 : 2010 | Identical |
PN EN 60191-6-20 : 2011 | Identical |
UNE-EN 60191-6-20:2010 | Identical |
BS EN 60191-6-20:2010 | Identical |
CEI EN 60191-6-20 : 2011 | Identical |
DIN EN 60191-6-20:2011-03 | Identical |
PNE-FprEN 60191-6-20 | Identical |
EN IEC 60191-1:2018 | Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
I.S. EN IEC 60191-1:2018 | MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 1: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF DISCRETE DEVICES |
IEC 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
IEC 60191-4:2013 | Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages |
EN 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
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