EN 60444-8:2017

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC60444-8:2016(E) describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC60444-5 and for the determination of load resonance frequency and load resonance resistance according to IECTR60444-4 and IEC60444-11.Two test fixtures are described in this document:1) A fixture using the p-network circuit with electrical values as described in IEC60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC60444-4. The range of load capacitance is 10pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC60444-11.This edition includes the following significant technical changes with respect to the previous edition:a) modification of Clause 1;b) modification of 5.2;c) modification of 5.3;d) modification of 5.4;e) 6.3 Calibration of the reflection measurement system.