EN 60689:2009
Current
The latest, up-to-date edition.
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
27-03-2009
1 Scope
2 Normative references
3 Overview
3.1 General
3.2 Applied frequency range
3.3 Measurement method
3.4 Load capacitance
3.5 Recommended drive level
3.6 Measurement conditions
3.7 Measurement of frequency-temperature
characteristics
3.8 Load capacitance frequency characteristics
4 Measurement methods
4.1 Method A
4.1.1 Vector network analyzer/vector impedance
analyzer
4.1.2 Block diagram
4.1.3 Specifications for vector network
analyzer/vector impedance analyzer
4.1.4 Test fixture
4.1.5 Measurement of equivalent circuit
constants
4.1.6 Frequency pulling
4.2 Method B
4.2.1 General
4.2.2 Block diagram
4.2.3 Calibration
4.2.4 Procedure
5 Measurement conditions
5.1 General
5.2 Measurement conditions
5.3 Measurement of the frequency-temperature
dependence
5.3.1 General
5.3.2 Block diagram
5.3.3 Determination of the turnover point and
parabolic coefficient beta (standard
reference method)
5.3.4 Measurement of the frequency versus
temperature characteristics (mass
production method)
5.3.5 Frequency C[L] curve
6 Test and environmental examination
6.1 Application of the definition of IEC 60122-1
6.2 Magnetism - Influence of a magnetic field on the
frequency
6.3 Enclosure
6.4 Measuring conditions and electric performance
6.4.1 General
6.4.2 Measurement conditions
6.4.3 Standard values
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 60689:2008(E) applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.
Committee |
CLC/SR 49
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
CEI EN 60689 : 2009 | Identical |
BS EN 60689:2009 | Identical |
I.S. EN 60689:2009 | Identical |
PN EN 60689 : 2009 | Identical |
NEN EN IEC 60689 : 2009 | Identical |
NBN EN 60689 : 2009 | Identical |
DIN EN 60689:2009-08 | Identical |
IEC 60689:2008 | Identical |
NF EN 60689 : 2014 | Identical |
UNE-EN 60689:2009 | Identical |
PNE-prEN 60689 | Identical |
BS EN 60127-1:2006+A2:2015 | Identical |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
IEC 60068-2-31:2008 | Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens |
IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
Q C 001005 : 1995 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER THE IECQ SYSTEM, INCLUDING ISO 900 |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
EN 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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