EN 60747-16-10:2004
Current
The latest, up-to-date edition.
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
30-09-2004
FOREWORD
Foreword to this particular Technology Approval Schedule (TAS)
Organizations responsible for preparing the present TAS
Preface
INTRODUCTION
1 General
1.1 Scope
1.2 Normative documents
1.3 Units, symbols and terminology
1.4 Standard and preferred values
1.5 Definitions
2 Definition of the component technology
2.1 Scope
2.2 Description of activities and flow charts
2.3 Technical abstract
2.4 Requirements for control of subcontractors
3 Component design of MMICs
3.1 Scope
3.2 Description of activities and flow charts
3.3 Interfaces
3.4 Validations and control of the processes
4 Mask manufacture
4.1 Scope
4.2 Description of activities and flow charts
4.3 Validation and control of the processes
4.4 Subcontractors, vendors and internal suppliers
5 Wafer fabrication of MMICs
5.1 Scope
5.2 Description of activities and flow charts
5.3 Equipment
5.4 Materials
5.5 Re-work
5.6 Validation methods and control of the processes
5.7 Interrelationship
6 Wafer probing of MMICs
6.1 Scope
6.2 Description of activities and flow charts
6.3 Equipment
6.4 Test procedures
6.5 Interrelationship
7 Back-side process for bare chip delivery
7.1 Scope
7.2 Description of activity and flow charts
7.3 Equipment
7.4 Materials
7.5 Validation methods and control of the processes
7.6 Interrelationship
7.7 Validity of release
8 Assembly of MMICs
8.1 Scope
8.2 Description of activities and flow charts
8.3 Materials, inspection and handling
8.4 Equipment
8.5 Re-work
8.6 Validation and control of the processes
8.7 Interrelationships
9 Testing of MMICs
9.1 Scope
9.2 Description of activities and flow charts
9.3 Equipment
9.4 Test procedures
9.5 Interfaces
9.6 Validation and control of the processes
9.7 Process boundary verification
9.8 Product verification
10 Process characterization
10.1 Identification of process characteristics
10.2 Description of activities
10.3 Characterization procedures
11 Packaging and shipping
11.1 Description of activities and flow charts
11.2 Interfaces
11.3 Validity of release
12 Withdrawal of Technology Approval
Figures
Specifies the terms, definitions, symbols, quality system, test, assessment and verification methods and other requirements relevant to the design, manufacture and supply of monolithic microwave integrated circuits in compliance with the general requirements of the IECQ-CECC System for electronic components of assessed quality.
Committee |
CLC/TC 47X
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
IEC 60747-16-10:2004 | Identical |
NBN EN 60747-16-10 : 2006 | Identical |
NEN EN IEC 60747-16-10 : 2004 | Identical |
I.S. EN 60747-16-10:2004 | Identical |
PN EN 60747-16-10 : 2005 | Identical |
UNE-EN 60747-16-10:2004 | Identical |
BS EN 60747-16-10:2004 | Identical |
CEI EN 60747-16-10 : 2005 | Identical |
NF EN 60747-16-10 : 2005 | Identical |
DIN EN 60747-16-10:2005-03 | Identical |
BS EN 60255-22-1:2008 | Identical |
PNE-prEN 60747-16-10 | Identical |
HD 245.4 : 200S1 | LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - SYMBOLS OF QUANTITIES TO BE USED FOR ROTATING ELECTRICAL MACHINES |
IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV | Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60747-16-1:2002/A2:2017 | SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017) |
IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV | Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers |
IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV | Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters |
IEC 60747-16-2:2001+AMD1:2007 CSV | Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.