BS EN 61747-5:1998
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Liquid crystal and solid-state display devices Environmental, endurance and mechanical test methods |
BS IEC 60748-23-3:2002
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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers\' self-audit checklist and report |
BS EN 190100:1993
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Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
BS QC750116(2000) : 2000
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION |
BS EN 60749:1999
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Semiconductor devices. Mechanical and climatic test methods |
BS EN 60747-16-10:2004
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Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
BS IEC 60748-2:1997
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Semiconductor devices. Integrated circuits Digital integrated circuits |
BS EN 165000-1:1996
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Film and hybrid integrated circuits Generic specification. Capability approval procedure |
IEC 61747-5:1998
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Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
EN 61964:1999
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Integrated circuits - Memory devices pin configurations |
EN 61747-5:1998
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Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
OVE/ONORM EN 60027-2 : 2007
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LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
06/30153491 DC : DRAFT JULY 2006
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EN 60748-2-20 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS |
BS IEC 60748-5:1997
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Semiconductor devices. Integrated circuits Semicustom integrated circuits |
BS EN 61964:1999
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Integrated circuits. Memory devices pin configurations |
CEI EN 60747-16-10 : 2005
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SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS |
BS IEC 60748-11:2000
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Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
I.S. EN 60027-2:2007
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LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
I.S. EN 60747-16-10:2004
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SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS |
IEC 60748-23-2:2002
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Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV
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Semiconductor devices - Mechanical and climatic test methods |
BS CECC 90300:1988
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Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
BS CECC17000(1992) : 1992 AMD 9626
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST |
11/30252972 DC : 0
|
BS EN 61747-10-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL |
BS IEC 60748-23-1:2002
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Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification |
BS QC 763000(1990) : AMD 6754
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID FILM INTEGRATED CIRCUITS. GENERIC SPECIFICATION |
BS QC790100(1991) : 1991 AMD 10586
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
IEC 60748-11:1990
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Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
IEC 60747-10:1991
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Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
IEC 60748-23-1:2002
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Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification |
I.S. EN 61747-5:1999
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LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS |
IEC 60748-4:1997
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Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
01/205674 DC : DRAFT JUL 2001
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IEC 60747-16-10 ED.1 - TECHNOLOGY APPROVAL SCHEDULE FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS |
11/30252977 DC : 0
|
BS EN 61747-10-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - ENVIRONMENTAL AND ENDURANCE |
NF EN 60027-2 : 2007
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LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
BS EN 61747-1:2000
|
Liquid crystal and solid-state display devices Generic specification |
I.S. EN 61964:2000
|
INTEGRATED CIRCUITS - MEMORY DEVICES PIN CONFIGURATIONS |
I.S. EN 165000-1:1998
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FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE |
IEC 61747-10-2:2014
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Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance |
IEC 61747-1:1998+AMD1:2003 CSV
|
Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 61964:1999
|
Integrated circuits - Memory devices pin configurations |
IEC 60747-16-10:2004
|
Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
DIN EN 190000:1996-05
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GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
BS IEC 60747-4.2 : 2000
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION |
BS IEC 60748-23-2:2002
|
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection and special tests |
BIS IS 15934-5 : 2011
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LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS |
IEC 60748-2:1997
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Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
IEC 60748-23-3:2002
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Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report |
BS EN 45510-2-2:1999
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Guide for the procurement of power station equipment. Electrical equipment Uninterruptible power supplies - Uninterruptible power supplies for power plants |
EN 60747-16-10:2004
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Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
EN 165000-1:1996
|
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure |
EN 60749 : 99 AMD 2 2001
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
BS CECC90100(1987) : AMD 7845
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS |