• IEC 60748-1:2002

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    Semiconductor devices - Integrated circuits - Part 1: General

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  08-05-2002

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope and object
    2 Normative references
    3 Presentation and requirements of the IEC 60748 series
    4 Terminology
       4.1 General terms
       4.2 Types of devices
       4.3 Clamping characteristics of integrated circuits
       4.4 Technological concepts
       4.5 Particular device types of integrated circuits
    5 Letter symbols
       5.1 Basic letters
       5.2 Subscripts for digital integrated circuits
       5.3 Subscripts for analogue integrated circuits
    6 Essential ratings and characteristics
       6.1 Introduction
       6.2 Standard format for the presentation of published
            data
       6.3 Method for describing essential ratings and
            characteristics and function specification of
            integrated circuits
       6.4 Definitions
       6.5 Definitions of cooling conditions
       6.6 List of preferred temperatures
       6.7 List of preferred voltages
       6.8 Mechanical ratings, characteristics and other data
       6.9 Production spread and compliance
       6.10 Printed wiring and printed circuits
       6.11 General scheme for all types of integrated circuits
    7 Measuring methods
       7.1 Basic requirements
       7.2 Specific requirements on the measuring methods
       7.3 Numbering system for measuring methods
    8 Acceptance and reliability of integrated circuits
       8.1 General remarks
       8.2 General principles
       8.3 Electrical endurance tests
    9 Electrostatic sensitive devices

    Abstract - (Show below) - (Hide below)

    Constitutes the general part of IEC 60748. Together with the relevant material of IEC 60747-1, it gives general information on integrated circuits.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note Supersedes IEC 60148 (03/2001) Also numbered as BS 6493-2.1(1985) (08/2002) To be read in conjunction with IEC 60747-1 and IEC 60050-521. (09/2002) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61747-5 : 1998 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
    01/205674 DC : DRAFT JUL 2001 IEC 60747-16-10 ED.1 - TECHNOLOGY APPROVAL SCHEDULE FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS
    11/30252977 DC : 0 BS EN 61747-10-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - ENVIRONMENTAL AND ENDURANCE
    11/30252972 DC : 0 BS EN 61747-10-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL
    BS IEC 60748-23-3:2002 Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist and report
    BS EN 190100 : 1993 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS
    DIN EN 190000:1996-05 GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS
    06/30153491 DC : DRAFT JULY 2006 EN 60748-2-20 - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 2-20: DIGITAL INTEGRATED CIRCUITS - FAMILY SPECIFICATION - LOW VOLTAGE INTEGRATED CIRCUITS
    BS QC750116(2000) : 2000 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
    BS EN 60749 : 1999 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    BS IEC 60748-23-1:2002 Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification
    BS IEC 60748-5 : 1997 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - SEMICUSTOM INTEGRATED CIRCUITS
    BS EN 60747-16-10 : 2004 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS
    BS CECC90300(1988) : 1988 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: INTERFACE MONOLITHIC INTEGRATED CIRCUITS
    BS QC 763000(1990) : AMD 6754 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID FILM INTEGRATED CIRCUITS. GENERIC SPECIFICATION
    BS EN 61964 : 1999 INTEGRATED CIRCUITS - MEMORY DEVICES PIN CONFIGURATIONS
    BS IEC 60748-2 : 1997 SEMICONDUCTORS DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS
    BS IEC 60747-4.2 : 2000 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
    BS CECC17000(1992) : 1992 AMD 9626 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST
    BS CECC90100(1987) : AMD 7845 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS
    BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
    CEI EN 60747-16-10 : 2005 SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS
    BS EN 165000-1 : 1996 FILM AND HYBRID INTEGRATED CIRCUITS - GENERIC SPECIFICATION - PART 1: CAPABILITY APPROVAL PROCEDURE
    BS IEC 60748-23-2:2002 Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection and special tests
    NF EN 60027-2 : 2007 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    BS EN 61747-1 : 2000 LIQUID CRYSTAL AND SOLID STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION
    BS IEC 60748-11 : 2000 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 11: SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
    I.S. EN 61964:2000 INTEGRATED CIRCUITS - MEMORY DEVICES PIN CONFIGURATIONS
    I.S. EN 60027-2:2007 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    I.S. EN 60747-16-10:2004 SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS
    I.S. EN 165000-1:1998 FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE
    BIS IS 15934-5 : 2011 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
    IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
    IEC 60748-23-3:2002 Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
    IEC 61747-10-2:2014 Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance
    IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60748-23-1:2002 Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
    I.S. EN 61747-5:1999 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
    IEC 60748-23-2:2002 Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
    IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
    BS EN 45510-2-2 : 1999 GUIDE FOR THE PROCUREMENT OF POWER STATION EQUIPMENT - ELECTRICAL EQUIPMENT - UNINTERRUPTIBLE POWER SUPPLIES
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
    IEC 61964:1999 Integrated circuits - Memory devices pin configurations
    IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
    EN 61964 : 1999 INTEGRATED CIRCUITS - MEMORY DEVICES PIN CONFIGURATIONS
    EN 61747-5 : 1998 LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
    EN 60747-16-10:2004 SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS
    EN 165000-1:1996 Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
    EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60319:1999 Presentation and specification of reliability data for electronic components
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60617-13:1993 Graphical symbols for diagrams - Part 13: Analogue elements
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    IEC 60617-12:1997 Graphical symbols for diagrams - Part 12: Binary logic elements
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