EN 60749-2:2002
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
13-08-2002
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-2:2002 | Identical |
| NF EN 60749-2 : 2002 | Identical |
| UNE-EN 60749-2:2003 | Identical |
| NBN EN 60749-2 : 2003 | Identical |
| NEN EN IEC 60749-2 : 2002 | Identical |
| I.S. EN 60749-2:2002 | Identical |
| PN EN 60749-2 : 2004 | Identical |
| BS EN 60749-2:2002 | Identical |
| CEI EN 60749-2 : 2004 | Identical |
| DIN EN 60749-2:2003-04 | Identical |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| EN 60068-2-13:1999 | Environmental testing - Part 2: Tests - Test M: Low air pressure |
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