EN 60749-31:2003
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Published date
20-06-2003
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FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-31 : 2003 | Identical |
| IEC 60749-31:2002 | Identical |
| NBN EN 60749-31 : 2004 | Identical |
| NEN EN IEC 60749-31 : 2003 | Identical |
| I.S. EN 60749-31:2003 | Identical |
| PN EN 60749-31 : 2005 | Identical |
| SN EN 60749-31 : 2003 | Identical |
| UNE-EN 60749-31:2004 | Identical |
| BS EN 60749-31:2003 | Identical |
| CEI EN 60749-31 : 2004 | Identical |
| DIN EN 60749-31:2003-12 | Identical |
| BS EN 61073-1:2009 | Identical |
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