EN 61643-321:2002
Current
The latest, up-to-date edition.
Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD)
21-02-2002
1 Scope
2 Normative references
3 Definitions and symbols
4 Basic function and description for ABDs
5 Service conditions
6 Standard test methods and procedures
6.1 Standard design test criteria
6.2 Test conditions
6.3 Clamping voltage V[c] (see figure 2)
6.4 Rated peak impulse current I[PPM] (see figure 2)
6.5 Maximum working voltage V[WM] and maximum working
r.m.s. voltage V[WM[rms]] (see figure 3)
6.6 Stand-by current I[D] (see figure 3)
6.7 Breakdown (avalanche) voltage V[BR] (see figure 4)
6.8 Capacitance C [j]
6.9 Rated peak impulse power dissipation P[PPM]
6.10 Rated forward surge current I[FSM] (see figure 1c)
6.11 Forward voltage V[FS]
6.12 Temperature coefficient of breakdown voltage alpha
V[BR]
6.13 Temperature derating (see figure 5)
6.14 Thermal resistance R[thJA] or R[thJC] or R[thJL]
6.15 Transient thermal impedance Z[thJA] or Z[thJC] or
Z[thJL]
6.16 Rated average power dissipation P[MAV]
6.17 Peak overshoot voltage V[OS] (see figure 7)
6.18 Overshoot duration (see figure 7)
6.19 Response time (see figure 7)
7 Fault and failure modes
7.1 Degradation fault mode
7.2 Short-circuit failure mode
7.3 Open-circuit failure mode
7.4 "Fail-safe" operation
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Figures
Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.
Committee |
CLC/SR 37B
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
VDE 0845-5-2 : 2003 | Identical |
PN EN 61643-321 : 2003 | Identical |
UNE-EN 61643-321:2003 | Identical |
NBN EN 61643-321 : 2002 | Identical |
NF EN 61643-321 : 2002 | Identical |
BS EN 61643-321:2002 | Identical |
I.S. EN 61643-321:2002 | Identical |
DIN EN 61643-321 : 2003 | Identical |
IEC 61643-321:2001 | Identical |
NEN EN IEC 61643-321 : 2002 | Identical |
CEI EN 61643-321 : 2003 | Identical |
I.S. CLC TS 61643-22:2006 | LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 22: SURGE PROTECTIVE DEVICES CONNECTED TO TELECOMMUNICATIONS AND SIGNALLING NETWORKS - SELECTION AND APPLICATION PRINCIPLES |
05/30134962 DC : DRAFT JUN 2005 | CENELEC TS 61643-22 - LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 22: SURGE PROTECTIVE DEVICES CONNECTED TO TELECOMMUNICATIONS AND SIGNALLING NETWORKS - SELECTION AND APPLICATION PRINCIPLES |
DD CLC/TS 61643-22:2006 | Low-voltage surge protective devices Surge protective devices connected to telecommunications and signalling networks. Selection and application principles |
I.S. EN 62368-1:2014 | AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS (IEC 62368-1:2014, MODIFIED) |
EN 62368-1:2014/AC:2017-03 | AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS (IEC 62368-1:2014, MODIFIED) |
EN 60749 : 99 AMD 2 2001 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
IEC 60364-3:1993 | Electrical installations of buildings - Part 3: Assessment of general characteristics |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
HD 384.3 : 200S2 | ELECTRICAL INSTALLATIONS OF BUILDINGS - ASSESSMENT OF GENERAL CHARACTERISTICS |
IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
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