• EN 61643-321:2002

    Current The latest, up-to-date edition.

    Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD)

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    Published date:  21-02-2002

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Definitions and symbols
    4 Basic function and description for ABDs
    5 Service conditions
    6 Standard test methods and procedures
       6.1 Standard design test criteria
       6.2 Test conditions
       6.3 Clamping voltage V[c] (see figure 2)
       6.4 Rated peak impulse current I[PPM] (see figure 2)
       6.5 Maximum working voltage V[WM] and maximum working
            r.m.s. voltage V[WM[rms]] (see figure 3)
       6.6 Stand-by current I[D] (see figure 3)
       6.7 Breakdown (avalanche) voltage V[BR] (see figure 4)
       6.8 Capacitance C [j]
       6.9 Rated peak impulse power dissipation P[PPM]
       6.10 Rated forward surge current I[FSM] (see figure 1c)
       6.11 Forward voltage V[FS]
       6.12 Temperature coefficient of breakdown voltage alpha
            V[BR]
       6.13 Temperature derating (see figure 5)
       6.14 Thermal resistance R[thJA] or R[thJC] or R[thJL]
       6.15 Transient thermal impedance Z[thJA] or Z[thJC] or
            Z[thJL]
       6.16 Rated average power dissipation P[MAV]
       6.17 Peak overshoot voltage V[OS] (see figure 7)
       6.18 Overshoot duration (see figure 7)
       6.19 Response time (see figure 7)
    7 Fault and failure modes
       7.1 Degradation fault mode
       7.2 Short-circuit failure mode
       7.3 Open-circuit failure mode
       7.4 "Fail-safe" operation
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications
    Figures

    Abstract - (Show below) - (Hide below)

    Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 37B
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. CLC TS 61643-22:2006 LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 22: SURGE PROTECTIVE DEVICES CONNECTED TO TELECOMMUNICATIONS AND SIGNALLING NETWORKS - SELECTION AND APPLICATION PRINCIPLES
    05/30134962 DC : DRAFT JUN 2005 CENELEC TS 61643-22 - LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 22: SURGE PROTECTIVE DEVICES CONNECTED TO TELECOMMUNICATIONS AND SIGNALLING NETWORKS - SELECTION AND APPLICATION PRINCIPLES
    DD CLC/TS 61643-22:2006 Low-voltage surge protective devices Surge protective devices connected to telecommunications and signalling networks. Selection and application principles
    I.S. EN 62368-1:2014 AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS (IEC 62368-1:2014, MODIFIED)
    EN 62368-1:2014/AC:2017-03 AUDIO/VIDEO, INFORMATION AND COMMUNICATION TECHNOLOGY EQUIPMENT - PART 1: SAFETY REQUIREMENTS (IEC 62368-1:2014, MODIFIED)

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    IEC 60364-3:1993 Electrical installations of buildings - Part 3: Assessment of general characteristics
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    HD 384.3 : 200S2 ELECTRICAL INSTALLATIONS OF BUILDINGS - ASSESSMENT OF GENERAL CHARACTERISTICS
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
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