EN 61788-17:2013

FOREWORD
INTRODUCTION
1 Scope
2 Normative reference
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty in the test method
8 Test report
Annex A (informative) - Additional information
        relating to Clauses 1 to 8
Annex B (informative) - Optional measurement systems
Annex C (informative) - Uncertainty considerations
Annex D (informative) - Evaluation of the uncertainty
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their corresponding
         European publications

IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.