EN 62215-3:2013

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Coupling networks
6 IC configuration and evaluation
7 Test conditions
8 Test equipment
9 Test set up
10 Test procedure
11 Test report
Annex A (informative) - Test board recommendations
Annex B (informative) - Selection hints for
        coupling and decoupling network values
Annex C (informative) - Industrial and consumer
        applications
Annex D (informative) - Vehicle applications
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.