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  • EN 62215-3:2013

    Current The latest, up-to-date edition.

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

    Available format(s): 

    Language(s): 

    Published date:  04-10-2013

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General
    5 Coupling networks
    6 IC configuration and evaluation
    7 Test conditions
    8 Test equipment
    9 Test set up
    10 Test procedure
    11 Test report
    Annex A (informative) - Test board recommendations
    Annex B (informative) - Selection hints for
            coupling and decoupling network values
    Annex C (informative) - Industrial and consumer
            applications
    Annex D (informative) - Vehicle applications
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47A
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62228-2:2017 Integrated circuits. EMC evaluation of transceivers LIN transceivers
    CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    IEC 61000-4-4 : 3.0EN+(REDLINE+VERSION) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST
    IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    ISO 7637-2:2011 Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
    IEC 61000-4-4:2012 RLV Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
    EN 61000-4-4:2012 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC 61000-4-4:2012)
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