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I.S. EN 60444-6:2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))

Available format(s)

Hardcopy , PDF

Superseded date

28-10-2021

Superseded by

I.S. EN IEC 60444-6:2021

Language(s)

English

Published date

01-01-2013

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

€37.00
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 DLD effects
4 Drive levels for DLD measurement
5 Test methods
Annex A (normative) - Relationship between
        electrical drive level and mechanical
        displacement of quartz crystal units
Annex B (normative) - Method C: DLD measurement
        with oscillation circuit
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Pertains to the measurements of drive level dependence (DLD) of quartz crystal units.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
25
PublisherName
National Standards Authority of Ireland
Status
Superseded
SupersededBy

Standards Relationship
SN EN 60444-6 : 1997 Identical
NF EN 60444-6 : 2014 Identical
DIN EN 60444-6:2014-02 Identical
NBN EN 60444-6 : 2013 Identical
BS EN 60444-6:2013 Identical
EN 60444-6:2013 Identical

IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
EN 60444-1:1997/A1:1999 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK
EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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