I.S. EN 60444-6:2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))
Hardcopy , PDF
28-10-2021
English
01-01-2013
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 DLD effects
4 Drive levels for DLD measurement
5 Test methods
Annex A (normative) - Relationship between
electrical drive level and mechanical
displacement of quartz crystal units
Annex B (normative) - Method C: DLD measurement
with oscillation circuit
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Pertains to the measurements of drive level dependence (DLD) of quartz crystal units.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
25
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
SN EN 60444-6 : 1997 | Identical |
NF EN 60444-6 : 2014 | Identical |
DIN EN 60444-6:2014-02 | Identical |
NBN EN 60444-6 : 2013 | Identical |
BS EN 60444-6:2013 | Identical |
EN 60444-6:2013 | Identical |
IEC 60444-8:2016 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
EN 60444-1:1997/A1:1999 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK |
EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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