I.S. EN 61747-1:2000 AMD 1 2003

1 Scope
2 Normative references
3 Terminology
      3.1 Physical concepts
      3.2 General terms
      3.3 Terms related to ratings and characteristics
4 Technical aspects
      4.1 Order of precedence
      4.2 Terminology, units and symbols
      4.3 Preferred values of temperature, humidity and
             pressure
      4.4 Marking
             4.4.1 Device identification
             4.4.2 Device traceability
             4.4.3 Packing
      4.5 Categories of assessed quality
      4.6 Screening
      4.7 Handling
5 Quality assessment procedures
      5.1 Eligibility for qualification approval
             5.1.1 Primary stage of manufacture
      5.2 Commercially confidential information
      5.3 Formation of inspection lots
      5.4 Structurally similar devices
      5.5 Granting of qualification approval
      5.6 Quality conformance inspection
             5.6.1 Division into groups and subgroups
             5.6.2 Inspection requirements
             5.6.3 Supplementary procedure for reduced
                      inspection
             5.6.4 Sampling requirements for small lots
             5.6.5 Certified records of released lots
                      (CRRL)
             5.6.6 Delivery of devices subjected to
                      destructive or non-destructive tests
             5.6.7 Delayed deliveries
             5.6.8 Supplementary procedure for deliveries
      5.7 Statistical sampling procedures
             5.7.1 AQL sampling plans
             5.7.2 LTPD sampling plans
      5.8 Endurance tests
      5.9 Endurance tests where the failure rate is
             specified
             5.9.1 General
             5.9.2 Selection of samples
             5.9.3 Failure
             5.9.4 Endurance test time and sample size
             5.9.5 Procedure to be used if the number of
                      observed failures exceeds the
                      acceptance number
      5.10 Accelerated test procedures
      5.11 Capability approval
6 Test and measurement procedures
      6.1 Standard atmospheric conditions for electrical
             and optical measurements
      6.2 Physical examination
             6.2.1 Visual examination
             6.2.2 Dimensions
             6.2.3 Permanence of marking
      6.3 Electrical and optical measurements
             6.3.1 General conditions and precautions
      6.4 Environmental tests
Annex A (informative) Cross references index
Annex B (informative) Example of outline drawings of liquid
                      crystal display cells
Annex C (normative) Orientation of LCD modules
Annex D (normative) Lot tolerance percentage defective
                    (LTPD) sampling plans
Table D.1 - LTPD sampling plans - Minimum size of samples to
            be tested to ensure, with a 90 percent
            confidence, that a lot having a percentage of
            defective devices equal to the specified LTPD
            will not be accepted (single sample)
Table D.2 - Hypergeometric sampling plans for small lot
            sizes of 200 or less
Table D.3 - AQL and LTPD sampling plans

Covers general procedures for quality assessment to be used in the IECQ system and gives general rules for measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.