I.S. EN 62319-1:2005

FOREWORD
1 General
  1.1 Scope
  1.2 Normative references
2 Technical data
  2.1 Units and symbols
  2.2 Terms and definitions
  2.3 Preferred values
  2.4 Marking
3 Quality assessment procedures
  3.1 General
  3.2 Primary stage of manufacture
  3.3 Subcontracting
  3.4 Structurally similar components
  3.5 Qualification approval procedures
  3.6 Rework and repair
  3.7 Release for delivery
  3.8 Certified test records of released lots
  3.9 Delayed delivery
  3.10 Alternative test methods
  3.11 Manufacture outside the geographical limits of
       IECQ NSIs
  3.12 Unchecked parameters
4 Test and measurement procedures
  4.1 Standard conditions for testing
  4.2 Drying and recovery
  4.3 Visual inspection and check of dimensions
  4.4 Zero power resistance
  4.5 Insulation resistance (for insulated types only)
  4.6 Voltage proof (for insulated types only)
  4.7 Robustness of terminations (for leaded types only)
  4.8 Soldering
  4.9 Mounting
  4.10 Rapid change of temperature
  4.11 Climatic sequence
  4.12 Cycle life testing
  4.13 Trip endurance
  4.14 Trip current
  4.15 Hold current
  4.16 Residual current and power dissipation
  4.17 Time-to-trip
  4.18 Cold environmental electrical cycling
  4.19 Thermal runaway
Annex A (normative) Fixed sample size test schedules
        for qualification approval
Annex B (normative) Vibration-, bump-, shock-, shear-,
        substrate bending test
      B.1 Vibration
      B.2 Bump
      B.3 Shock
      B.4 Shear (adhesion) test
      B.5 Substrate bending test

Specifies terms and methods of test for polymeric positive temperature coefficient thermistors, insulated and non-insulated types, typically intended for use in current limiting and overcurrent protection applications.