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IEC 60749-42:2014
Current
Current
The latest, up-to-date edition.
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Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French
Published date
12-08-2014
Publisher
FOREWORD
1 Scope
2 Normative references
3 Test equipment
4 Procedure
5 Failure criteria
6 Information to be given in applicable
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