IEC 61967-2:2005
Current
The latest, up-to-date edition.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
29-09-2005
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
5.1 General
5.2 Supply voltage
5.3 Frequency range
6 Test equipment
6.1 General
6.2 Shielding
6.3 RF measuring instrument
6.4 Preamplifier
6.5 TEM cell
6.6 Wideband TEM/GTEM cell
6.7 50-Ohm termination
6.8 System gain
7 Test set-up
7.1 General
7.2 Test configuration
7.3 Test PCB
8 Test procedure
8.1 General
8.2 Ambient measurement
8.3 DUT operational check
8.4 DUT emissions measurement
9 Test report
9.1 General
9.2 Measurement conditions
10 IC emissions reference levels
Annex A (informative) Example calibration & set-up
verification sheet
Annex B (informative) TEM cell and wideband TEM cell
descriptions
B.1 TEM cell
B.2 Wideband GTEM cell
Annex C (informative) Calculation of dipole moment from
measured data
C.1 General
C.2 Dipole moment calculation
Annex D (informative) Specification of emissions data
D.1 General
D.2 Specification of emission levels
D.3 Presentation of results
D.4 Examples
Bibliography
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell. The test board is not inside the cell, as in the conventional usage, but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured radio frequency (RF) voltage will be affected by many factors. The primary factor affecting the measured RF voltage is the septum to IC test board (cell wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to floor spacing of 45 mm and a GTEM cell with average septum to floor spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations. A conversion factor may allow comparisons between data measured on TEM or GTEM cells with different septum to floor spacing. The IC test board controls the geometry and orientation of the operating IC relative to the cell and eliminates any connecting leads within the cell (these are on the backside of the board, which is outside the cell). For the TEM cell, one of the 50 ports is terminated with a 50 load. The other 50 port for a TEM cell, or the single 50 port for a GTEM cell, is connected to the input of a spectrum analyser or receiver that measures the RF emissions emanating from the integrated circuit and impressed onto the septum of the cell.
DevelopmentNote |
To be read in conjunction with IEC 61967-1. (10/2005) Stability Date: 2017. (10/2012)
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DocumentType |
Standard
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Pages |
43
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PublisherName |
International Electrotechnical Committee
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Status |
Current
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Standards | Relationship |
UNE-EN 61967-2:2005 | Identical |
EN 61967-2:2005 | Identical |
DIN EN 61967-2:2006-03 | Identical |
NEN EN IEC 61967-2 : 2005 | Identical |
I.S. EN 61967-2:2005 | Identical |
PN EN 61967-2 : 2006 | Identical |
SN EN 61967-2 : 2005 | Identical |
BS EN 61967-2:2005 | Identical |
CEI EN 61967-2 : 2006 | Identical |
NF EN 61967-2 : 2006 | Identical |
BS EN 61967-8:2011 | Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method |
PD IEC/TR 61967-4-1:2005 | Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4 |
EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
EN 62132-2:2011 | Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN 61967-5:2003 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method |
06/30152634 DC : DRAFT JULY 2006 | |
BS EN 61000-4-20:2003 | Electromagnetic Compatibility (EMC) Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
CEI EN 61967-1 : 2002 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
I.S. EN 61967-8:2011 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD (IEC 61967-8:2011 (EQV)) |
CEI EN 61000-4-20 : 2013 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
EN IEC 62969-1:2018 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
CEI EN 61967-8 : 2012 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD |
BS ISO 18257:2016 | Space systems. Semiconductor integrated circuits for space applications. Design requirements |
09/30191126 DC : DRAFT FEB 2009 | BS EN 62132-8 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 8: MEASUREMENT OF RADIATED IMMUNITY - IC STRIP LINE METHOD |
BS EN 62132-2:2011 | Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method |
I.S. EN 61967-5:2003 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD |
IEC 62969-1:2017 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
NF EN 62132-2 : 2011 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
BS EN 61967-5:2003 | Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method |
I.S. EN 62132-2:2011 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
ISO 18257:2016 | Space systems — Semiconductor integrated circuits for space applications — Design requirements |
I.S. EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
UNE-EN 61000-4-20:2011 | Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in Transverse Electromagnetic (TEM) waveguides - Basic EMC publication |
IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC 62132-2:2010 | Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN 61967-8 : 2011 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD |
16/30336986 DC : 0 | BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS |
CEI EN 62132-2 : 2012 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
06/30151320 DC : DRAFT JUN 2006 | BS IEC 62132-2 - INTEGRATED CIRCUITS, MEASUREMENT OF ELECTRO MAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED 1 MM UNITY TEM-CELL AND WIDEBAND TEM-CELLMETHOD |
IEC TR 61967-4-1:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4 |
IEC 61967-8:2011 | Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method |
IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
CISPR 16-2-2:2010 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-2: Methods of measurement of disturbances and immunity - Measurement of disturbance power |
IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements |
CISPR 16-1-1:2015 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus |
CISPR 16-1-3:2004+AMD1:2016 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power |
CISPR 16-2-1:2014 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1: Methods of measurement of disturbances and immunity - Conducted disturbance measurements |
CISPR 16-1-5:2014+AMD1:2016 CSV | Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz |
CISPR 16-2-4:2003 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-4: Methods of measurement of disturbances and immunity - Immunity measurements |
IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
CISPR 16-2-3:2016 | Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-3: Methods of measurement of disturbances and immunity - Radiated disturbance measurements |
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