IEC 61967-2:2005
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
IEC 62132-2:2010
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Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
IEC 61967-1:2002
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC TS 61967-3:2014
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Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
IEC 61967-8:2011
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Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method |
IEC 62132-4:2006
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Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
IEC 62132-5:2005
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Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method |
IEC 62132-1:2015
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Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
IEC 61967-5:2003
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method |
IEC 60529:1989+AMD1:1999+AMD2:2013 CSV
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Degrees of protection provided by enclosures (IP Code) |
IEC 61967-4:2002+AMD1:2006 CSV
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 62262:2002
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Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code) |
IEC 61967-6:2002+AMD1:2008 CSV
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 62132-3:2007
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Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method |
IEC 60749-10:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
IEC 60068-2-14:2009
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Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 61851-1:2017
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Electric vehicle conductive charging system - Part 1: General requirements |
IEC 60749-12:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |