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  • IEC TR 62014-3:2002

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Electronic design automation libraries - Part 3: Models of integrated circuits for EMI behavioural simulation

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Withdrawn date:  02-04-2024

    Language(s):  English

    Published date:  04-12-2002

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
       1.1 General
       1.2 Philosophy
    2 Normative references
    3 Definitions
    4 ICEM models description
       4.1 ICEM power-supply line model
       4.2 ICEM Input/output
       4.3 ICEM direct radiation
    5 ICEM models parts details
       5.1 Passive parts parameters
       5.2 The current sources I[b] and I[i/o]
    Annex A Simulation tools implementation
    Figures
    Table

    Abstract - (Show below) - (Hide below)

    Describes a model for EMI simulation due to IC internal activities. Gives more accurately the electromagnetic emissions of electronic equipment by taking into account the influence of internal activities. Gives general data which could be implemented in different format such as IBIS, IMIC, SPICE, etc

    General Product Information - (Show below) - (Hide below)

    Committee TC 91
    Development Note Stability Date: 2015. (10/2012)
    Document Type Technical Report
    Publisher International Electrotechnical Committee
    Status Withdrawn

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    IEC 62014-1:2001 Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2)
    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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