ANSI INCITS TR 35 : 2004 : R2009
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INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
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CEI EN 62008 : 2006
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PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
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IEEE DRAFT 1241 : D1.1 2001
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DRAFT STANDARD FOR TERMINOLOGY AND TEST METHODS FOR ANALOG-TO-DIGITAL CONVERTERS
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DKD-R 3-1-1 : 2010
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KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - BLATT 1: GRUNDLAGEN
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EN 62008:2005
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Performance characteristics and calibration methods for digital data acquisition systems and relevant software
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IEC 61671:2012
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Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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BS IEC 61671-2:2016
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Standard for automatic test markup language (ATML) instrument description
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IEEE 1139-2008
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IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities
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ANSI INCITS TR 35 : 2004
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INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
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BS EN 62008:2005
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Performance characteristics and caliberation for digital data acquisition systems and relevant software
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ANSI INCITS TR 35 : 2004 : R2014
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INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
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I.S. EN 62008:2005
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PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
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IEEE 1658-2011
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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
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DKD-R 3-1-3 : 2003
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KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - TEIL 3: SINUS- UND MULTISINUS-ANREGUNG
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BS IEC 61671:2012
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IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
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IEC 62754:2017
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Computation of waveform parameter uncertainties
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03/100280 DC : DRAFT FEB 2003
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IEC 62008 ED.1 - PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
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EN 62754:2017
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Computation of waveform Parameter uncertainties
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IEEE 1871.1-2014
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IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
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13/30261629 DC : 0
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BS EN 62792 - ELECTROSHOCK WEAPON MEASUREMENT METHOD
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IEEE 1671.2-2012
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IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
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IEEE 1696-2013
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IEEE Standard for Terminology and Test Methods for Circuit Probes
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IEC 62008:2005
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Performance characteristics and calibration methods for digital data acquisition systems and relevant software
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BS EN 62754:2017
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Computation of waveform parameter uncertainties
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IEC 61671-2:2016
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Standard for automatic test markup language (ATML) instrument description
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ISO/IEC TR 14165-117:2007
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Information technology Fibre Channel Part 117: Methodologies for jitter and signal quality (MJSQ)
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I.S. EN 62754:2017
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COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
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IEC 62792:2015
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Measurement method for the output of electroshock weapons
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CSA ISO/IEC TR 14165-117 : 2008 : R2013
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INFORMATION TECHNOLOGY - FIBRE CHANNEL - PART 117: METHODOLOGIES FOR JITTER AND SIGNAL QUALITY (MJSQ)
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CAN/CSA-ISO/IEC TR 14165-117-08 (R2018)
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Information technology - Fibre channel - Part 117: Methodologies for jitter and signal quality (MJSQ) (Adopted ISO/IEC TR 14165-117:2007, edition 1.0, 2007-09)
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