IEEE 1057-2007 REDLINE
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Standard for Digitizing Waveform Recorders
English
18-04-2008
02-03-2022
1 Overview
2 Normative references
3 Definitions
4 Test parameters and methods
5 Input impedance
6 Static gain and offset
7 Linearity
8 Noise
9 Step response parameters
10 Frequency response parameters
11 Interchannel parameters
12 Time base parameters
13 Out-of-range recovery
14 Word error rate
15 Differential input specifications
16 Cycle time
17 Triggering
Annex A (informative) - Sine fitting algorithms
Annex B (informative) - Phase noise
Annex C (informative) - Comment on errors associated with
word-error-rate measurement
Annex D (informative) - Measurement of randaom noise below
the quantization level
Annex E (informative) - Software consideration
Annex F (informative) - Excitation with precision source with ramp
verneir: determination of the test parameters
Annex G (informative) - Presentation of sine wave data
Annex H (informative) - Bibliography
This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with digital outputs.
| Committee |
TC10 - Waveform Generation Measurement and An
|
| DevelopmentNote |
Supersedes IEEE DRAFT 1057. (09/2008)
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-5350-6
|
| Pages |
210
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| ANSI INCITS TR 35 : 2004 : R2009 | INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ) |
| CEI EN 62008 : 2006 | PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE |
| IEEE DRAFT 1241 : D1.1 2001 | DRAFT STANDARD FOR TERMINOLOGY AND TEST METHODS FOR ANALOG-TO-DIGITAL CONVERTERS |
| DKD-R 3-1-1 : 2010 | KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - BLATT 1: GRUNDLAGEN |
| EN 62008:2005 | Performance characteristics and calibration methods for digital data acquisition systems and relevant software |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| BS IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| IEEE 1139-2008 | IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities |
| ANSI INCITS TR 35 : 2004 | INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ) |
| BS EN 62008:2005 | Performance characteristics and caliberation for digital data acquisition systems and relevant software |
| ANSI INCITS TR 35 : 2004 : R2014 | INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ) |
| I.S. EN 62008:2005 | PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE |
| IEEE 1658-2011 | IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices |
| DKD-R 3-1-3 : 2003 | KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - TEIL 3: SINUS- UND MULTISINUS-ANREGUNG |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEC 62754:2017 | Computation of waveform parameter uncertainties |
| 03/100280 DC : DRAFT FEB 2003 | IEC 62008 ED.1 - PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE |
| EN 62754:2017 | Computation of waveform Parameter uncertainties |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| 13/30261629 DC : 0 | BS EN 62792 - ELECTROSHOCK WEAPON MEASUREMENT METHOD |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| IEEE 1696-2013 | IEEE Standard for Terminology and Test Methods for Circuit Probes |
| IEC 62008:2005 | Performance characteristics and calibration methods for digital data acquisition systems and relevant software |
| BS EN 62754:2017 | Computation of waveform parameter uncertainties |
| IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| ISO/IEC TR 14165-117:2007 | Information technology — Fibre Channel — Part 117: Methodologies for jitter and signal quality (MJSQ) |
| I.S. EN 62754:2017 | COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES |
| IEC 62792:2015 | Measurement method for the output of electroshock weapons |
| DKD-R 3-1 Blatt 1 : 2019 | |
| DKD-R 3-1-2 : 2010 | KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - BLATT 2: STOSSANREGUNG |
| IEEE 181-2003 | IEEE Standard on Transitions, Pulses, and Related Waveforms |
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