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  • IEEE 1505.1-2008

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

    Available format(s):  PDF

    Superseded date:  26-08-2019

    Language(s):  English

    Published date:  01-08-2013

    Publisher:  Institute of Electrical & Electronics Engineers

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions, acronyms, and abbreviations
    4 Common test interface requirements
    Annex A (normative) - Common test interface signal
            definitions for pin map
    Annex B (informative) - Bibliography
    Annex C (informative) - IEEE List of Participants

    Abstract - (Show below) - (Hide below)

    Pertains to military and aerospace automatic test equipment (ATE) testing applications.

    General Product Information - (Show below) - (Hide below)

    Committee SCC20 - Test and Diagnosis for Electronic Sys
    Development Note Also numbered as IEC 63003. (12/2015)
    Document Type Standard
    Publisher Institute of Electrical & Electronics Engineers
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
    IEEE 1503.3 : 2015 THE UNIVERSAL TEST INTERFACE FRAMEWORK AND PIN CONFIGURATION FOR PORTABLE/BENCHTOP TEST REQUIREMENTS UTILIZING IEEE 1505 RECEIVER FIXTURE INTERFACE STANDARD
    BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
    IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    IEEE 1505.3-2015 IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 260.3-1993 American National Standard Mathematical Signs and Symbols for Use in Physical Sciences and Technology
    IEEE 1505-2006 IEEE Standard for Receiver Fixture Interface
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    IEEE 945-1984 IEEE Recommended Practice for Preferred Metric Units for Use in Electrical and Electronics Science and Technology
    IEEE/ASTM SI_10-2010 American National Standard for Metric Practice
    MIL-DTL-55302-180 Revision C:2008 Connectors, Printed Circuit Subassembly and Accessories: 4 Row, Receptacle Assemblies, Right Angle, 100 through 684 Contact Positions, for Printed Wiring Boards (.100 Spacing)
    MIL C 83733 : C CONNECTOR, ELECTRICAL, MINIATURE, RECTANGULAR TYPE, RACK TO PANEL, ENVIRONMENT RESISTING, 200 DEGREES C TOTAL CONTINUOUS OPERATING TEMPERATURE, GENERAL SPECIFICATION FOR
    IEEE 315 : 1975 GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS)
    MIL-HDBK-217 Revision F:1991 RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT
    MIL-DTL-55302-179 Revision C:2007 Connectors, Printed Circuit Subassembly and Accessories: 4 Row, Pin Assemblies, 100 through 684 Contact Positions, for Printed Wiring Boards(.100 Spacing)
    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
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