IEEE 1636.1-2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
01-04-2019
English
08-11-2013
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1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Test results and session information
5 EXPRESS model, EXPRESS-G diagram, and XML schema
names and locations
6 Conformance
7 Extensibility
Annex A (normative) - XML schemas
Annex B (normative) - EXPRESS models
Annex C (informative) - Bibliography
Presents definition of an exchange format, utilizing XML, for exchanging data resulting from executing tests of a Unit Under Test (UUT) via a test program in an automatic test environment.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Supersedes IEEE DRAFT 1636.1. (03/2008) Also numbered as IEC 61636-1. (11/2016)
|
| DocumentType |
Standard
|
| Pages |
94
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEC 61636-99:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEEE 1636.99-2013 | IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements. |
| BS IEC 61636:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA) |
| BS IEC 61636-1:2016 | Software interface for maintenance information collection and analysis (SIMICA): Exchanging test results and session information via the extensible markup language (XML) |
| BS IEC 61636-99:2016 | Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements |
| IEC 61636:2016 | Software interface for Maintenance Information Collection and Analysis (SIMICA) |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEEE 1636-2009 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA) |
| IEEE 1636.99-2013 | IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements. |
| ISO 10303-11:2004 | Industrial automation systems and integration Product data representation and exchange Part 11: Description methods: The EXPRESS language reference manual |
| IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE 1636-2009 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA) |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| MIL-STD-1309 Revision D:1992 | DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT |
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