IEEE 1671.3-2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
13-04-2018
English
28-03-2008
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1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. UUT Description schema
5. UUT Instance schema
6. ATML UUT Description XML schema names and locations
7. ATML XML schema extensibility
8. Conformance
Annex A (normative) - XML schemas
Annex B (informative) - IEEE download website material associated
with this document
Annex C (informative) - Describing UUT serial digital buses
Annex D (informative) - User information and examples
Annex E (informative) - Bibliography
Specifies an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
33
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| IEEE 1636.2-2010 | IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| TIA 232 : F1997(R2012) | INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE |
| MIL-HDBK-1553 Revision A:1988 | Multiplex Application Handbook |
| IEEE 1671-2006 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| IEEE 754-2008 REDLINE | IEEE Standard for Floating-Point Arithmetic |
| IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
| MIL-STD-1553 Revision B:1978 | DIGITAL TIME DIVISION COMMAND/RESPONSE MULTIPLEX DATA |
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