IEEE C62.35-2010
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
20-10-2021
English
31-08-2010
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1. Scope
2. Definitions
3. V-I Characteristics for a unidirectional ABD
4. Circuit symbols
5. Service conditions
6. Standard design test procedures
7. Failures and fault modes
8. Derived parameters and other test procedures
Annex A (informative) - Bibliography
Pertains to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). Covers terms, symbols and definitions, and gives test methods for verifying ratings and measuring device characteristics.
| Committee |
Surge Protective Devices/Low Voltage
|
| DocumentType |
Standard
|
| Pages |
37
|
| ProductNote |
NEW CHILD COR 1 IS NOW ADDED
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| Supersedes |
| IEEE C62.36-2014 REDLINE | IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits |
| IEEE C62.42-2005 | IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage [Equal to or Less than 1000 V (ac) Or 1200 V (dc)] Circuits |
| IEEE C62.23-1995 | IEEE Application Guide for Surge Protection of Electric Generating Plants |
| IEEE C62.42.0-2016 | IEEE Guide for the Application of Surge-Protective Components in Surge-Protective Devices and Equipment Ports--Overview |
| IEEE C62.43.0-2017 | IEEE Guide for Surge Protectors and Protective Circuits Used in Information and Communications Technology Circuits, Including Smart Grid Data Networks--Overview |
| IEEE C62.37 : 1996 | TEST SPECIFICATION FOR THYRISTOR DIODE SURGE PROTECTIVE DEVICES |
| IEC 61643-321:2001 | Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD) |
| IEC 60068-2-18:2017 | Environmental testing - Part 2-18: Tests - Test R and guidance: Water |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| IEC 60068-2-57:2013 | Environmental testing - Part 2-57: Tests - Test Ff: Vibration - Time-history and sine-beat method |
| IEC 60068-2-64:2008 | Environmental testing - Part 2-64: Tests - Test Fh: Vibration, broadband random and guidance |
| IEC 60695-2-13:2010+AMD1:2014 CSV | Fire hazard testing - Part 2-13: Glowing/hot-wire based test methods- Glow-wire ignition temperature (GWIT) test method for materials |
| IEC 60068-2-38:2009 | Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
| IEC 60749-33:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave |
| IEC 60068-2-47:2005 | Environmental testing - Part 2-47: Test - Mounting of specimens for vibration, impact and similar dynamic tests |
| IEC 61643-1:2005 | Low-voltage surge protective devices - Part 1: Surge protective devices connected to low-voltage power distribution systems - Requirements and tests |
| IEC 61051-2:1991 | Varistors for use in electronic equipment - Part 2: Sectional specification for surge suppression varistors |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| IEC 61180-1:1992 | High-voltage test techniques for low voltage equipment - Part 1: Definitions, test and procedure requirements |
| IEC 60060-1:2010 | High-voltage test techniques - Part 1: General definitions and test requirements |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
| IEC 60068-2-52:2017 | Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution) |
| IEC 60068-2-65:2013 | Environmental testing - Part 2-65: Tests - Test Fg: Vibration - Acoustically induced method |
| IEC 61051-1:2007 | Varistors for use in electronic equipment - Part 1: Generic specification |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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