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ISO 22493:2014

Current

Current

The latest, up-to-date edition.

Microbeam analysis — Scanning electron microscopy — Vocabulary

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

09-04-2014

€123.00
Excluding VAT

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

Committee
ISO/TC 202/SC 1
DevelopmentNote
Supersedes ISO/DIS 22493. (04/2014)
DocumentType
Standard
Pages
20
PublisherName
International Organization for Standardization
Status
Current
Supersedes

Standards Relationship
BS ISO 22493:2014 Identical
NF ISO 22493 : 2009 Identical

ISO/TR 19319:2013 Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
13/30290864 DC : 0 BS EN 16691 - WATER QUALITY - DETERMINATION OF POLYCYCLIC AROMATIC HYDROCARBONS (PAH) IN WHOLE WATER SAMPLES USING LIQUID SOLID EXTRACTION COMBINED WITH GAS CHROMATOGRAPHY MASS SPECTROMETRY (GC-MS)
16/30319120 DC : 0 BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS
ISO/TS 24597:2011 Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
DD ISO/TS 10798 : DRAFT JULY 2011 NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
17/30328207 DC : DRAFT SEP 2017 BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
ISO/TS 10797:2012 Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy
12/30245653 DC : 0 BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
XP ISO/TS 24597 : 2011 XP MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS
FD T16 203 : 2011 FD NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects

ISO 10241:1992 International terminology standards Preparation and layout
ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 704:2009 Terminology work — Principles and methods

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