• Shopping Cart
    There are no items in your cart

JEDEC JESD78F:2022

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

IC Latch-Up Test

Available format(s)

Hardcopy , PDF

Superseded date

20-01-2023

Superseded by

JEDEC JESD78F.01:2022

Language(s)

English

Published date

01-01-2022

Free

This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.

DocumentType
Revision
Pages
86
PublisherName
JEDEC Solid State Technology Association
Status
Superseded
SupersededBy
Supersedes

DSCC 22210:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 481,000 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS, FLIP CHIP Pb FREE BUMP, MONOLITHIC SILICON
DSCC 06233D:2023 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, LOW VOLTAGE CMOS, MINIMUM SKEW ONE-TO-EIGHT CLOCK DRIVER, LVTTL COMPATIBLE INPUTS AND OUTPUTS, MONOLITHIC SILICON
DSCC 89764D:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 8 DUAL PORT STATIC RANDOM ACCESS MEMORY, MONOLITHIC SILICON
DSCC 01517G:2022 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT PROM, MONOLITHIC SILICON
DSCC 07239B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K x 16-BIT (8M), STATIC RANDOM ACCESS MEMORY (SRAM), (3.3 V), MONOLITHIC SILICON
DSCC 07235B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K x 16-BIT (2M), STATIC RANDOM ACCESS MEMORY (SRAM), (3.3 V), MONOLITHIC SILICON
DSCC07241B:2024 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1M x 4-BIT (4M), STATIC RANDOM ACCESS MEMORY (SRAM), (3.3 V), MONOLITHIC SILICON
DSCC 96524L:2024 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, HEX INVERTER SCHMITT TRIGGER, MONOLITHIC SILICON
DSCC 93225C:2024 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K x 4 SRAM, MONOLITHIC SILICON
DSCC 96556K:2024 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN /PARALLEL-OUT SHIFT REGISTER, MONOLITHIC SILICON

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.