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MIL C 55681 : D SUPP 1

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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CAPACITOR, CHIP, MULTIPLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR

Superseded date

03-07-1997

Published date

12-01-2013

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Describes established reliability, ceramic dielectric, multiple layer, chip capacitors. Coverage includes classification, style, capacitance tolerance, termination finish, applicable documents, specification sheets, reliability, quality, body structure, terminations, voltage conditioning, body structure, capacitance, dissipation factor, insulation resistance, and solderabilty.

Committee
FSC 5910
DocumentType
Standard
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

MIL-STD-198 Revision E:1984 CAPACITOR, SELECTION AND USE OF
MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
MIL-HDBK-11991 Base Document:1996 DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPONS SYSTEMS
MIL D 83531 : A (3) DELAY LINES, PASSIVE
MIL-E-11991 Revision E:1983 ELECTRONIC, ELECTRICAL, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPON SYSTEMS, GENERAL SPECIFICATION FOR
MIL R 28750 : C SUPP 1 RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING
MIL D 83532 : A (3) SUPP 1 DELAY LINES, ACTIVE
MIL-P-11268 Revision L:1983 PART, MATERIALS, AND PROCESSES USED IN ELECTRONIC EQUIPMENT

MIL C 39028 : C CAPACITORS, PACKAGING OF
MIL-STD-810 Revision G:2008 ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS
EIA 554 : 1996 METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)
MIL-STD-790 Revision G:2011 Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications
QQ-S-571 Revision F:1994 SOLDER, ELECTRONIC (96 TO 485 DEGREES C)
MIL-F-14256 Revision F:1993 FLUX, SOLDERING, LIQUID (ROSIN BASE)
MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
MIL-STD-690 Revision D:2005 Failure Rate (FR) Sampling Plans and Procedures

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