MIL-PRF-55310 Revision E:2006
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Oscillator, Crystal Controlled, General Specification for
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Published date
31-03-2006
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - CLASS 2 OSCILLATOR QPL SYSTEM
REQUIREMENTS
APPENDIX B - COMPONENT EVALUATION SYSTEM
APPENDIX C - PROCEDURE FOR QUALIFICATION
INSPECTION
INDEX
Specifies the general requirements for quartz crystal oscillators used in electronic equipment.
| DevelopmentNote |
Supersedes MIL O 55310 (C). (04/2006)
|
| DocumentType |
Standard
|
| Pages |
328
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the general requirements for quartz crystal oscillators used in electronic equipment.
| MIL-PRF-55310-37 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS |
| DSCC 13018 : A | OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 32.768 KHZ TO 160 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL STD 11991 : A | GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES |
| BS IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| MIL-PRF-55310-40 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS |
| I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 61671-2:2016 | Standard for automatic test markup language (ATML) instrument description |
| MIL-PRF-55310-33 Revision D:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS |
| MIL-PRF-55310-38 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS |
| MIL-PRF-55310-13 Revision J:2010 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS |
| MIL-PRF-55310-29 Revision C:2011 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.2 MHz Through 85 MHz, Hermetic Seal, Square Wave, HCMOS |
| MIL-PRF-55310-35 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS |
| MIL-PRF-55310-32 Revision C:2017 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS |
| MIL-PRF-55310-18 Revision F:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 15.0 MHz, Hermetic Seal, Square Wave, CMOS |
| MIL-PRF-55310-8 Revision J:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 50 Hz Through 50 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-39 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS |
| MIL-PRF-55310-14 Revision H:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.1 Hz Through 25 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-21 Revision G:2008 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-12 Revision H:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS |
| MIL-PRF-55310-25 Revision D:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 25 MHz Through 175 MHz, Hermetic Seal, Square Wave, Emitter Coupled Logic |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| NASA MSFC STD 3012 : 2012 | ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE |
| MIL-PRF-55310-9 Revision J:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 400 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-28 Revision D:2017 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-15 Revision G:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS |
| MIL-PRF-55310-20 Revision F:2012 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 40.0 kHz Through 60.0 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-10 Revision J:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1khz Through 60 MHz, Hermetic Seal, Square Wave, TTL |
| DSCC 05014 : B | OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL-PRF-55310-11 Revision G:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS |
| MIL-PRF-55310-17 Revision F:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), Gated, 250 kHz Through 50 MHz, Hermetic Seal, Square Wave, TTL |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| MIL-PRF-55310-26 Revision D:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 10kHz Through 65 MHz, Hermetic Seal, Square Wave, High Speed CMOS |
| MIL-PRF-55310-27 Revision E:2017 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS |
| MIL-PRF-55310-16 Revision K:2017 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.1 Hz Through 80 MHz, Hermetic Seal, Square Wave, TTL |
| BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
| MIL-PRF-55310-30 Revision E:2017 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS |
| MIL-PRF-55310-31 Revision A:2010 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.75 MHz Through 200 MHz, Hermetic Seal, Square Wave, Advanced CMOS |
| EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
| DSCC 05013 : B | OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT |
| MIL-PRF-55310-34 Revision D:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS |
| MIL-PRF-55310-19 Revision E:2009 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 60.0 MHz, Hermetic Seal, Square Wave, TTL |
| MIL-PRF-55310-36 Revision C:2018 | Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-PRF-3098 Revision L:2017 | Crystal Units, Quartz General Specification for |
| MIL-STD-810 Revision G:2008 | ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
| MIL-PRF-55110 Revision H:2014 | Printed Wiring Board, Rigid, General Specification for |
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-PRF-38534 Revision J:2015 | Hybrid Microcircuits, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
| MIL-PRF-31032 Revision C:2016 | Printed Circuit Board/Printed Wiring Board, General Specification for |
| MIL-STD-790 Revision G:2011 | Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic, and Fiber Optic Parts Specifications |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-202 Revision H:2015 | Electronic and Electrical Component Parts |
| MIL-STD-1285 Revision D:2004 | Marking of Electrical and Electronic Parts |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| ASTM A 698/A698M : 2015 : REDLINE | Standard Test Method for Magnetic Shield Efficiency in Attenuating Alternating Magnetic Fields |
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