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NBN EN 60749-5 : 2004

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

Published date

12-01-2013

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Foreword
1 Scope
2 Normative references
3 General
4 Equipment
5 Test conditions
6 Procedures
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         Publications

Covers a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

DevelopmentNote
Supersedes NBN EN 60749. (04/2004)
DocumentType
Standard
PublisherName
Belgian Standards
Status
Current

Standards Relationship
DIN EN 60749-5:2003-09 Identical
NF EN 60749-5 : 2003 Identical
I.S. EN 60749-5:2017 Identical
EN 60749-5:2017 Identical
BS EN 60749-5:2017 Identical
UNE-EN 60749-5:2003 Identical

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